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Microscopy
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S4700 SEM

Microscopy methods are used to characterise micro and nanostructures fabricated within the JWNC. These include high resolution scanning electron microscopy, atomic force microscopy, surface profilometry and several different types of optical microscopy.

 

 
Lithography
Metallisation
Plasma Processing
Microscopy
Miscellaneous
Partner Facilities
 
 
Scanning Electron Microscopy
Atomic Force Microscopy
Surface Profilometry
Optical Microscopy
 

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